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Program at a Glance

Date Time Program
Nov. 23 (Mon.) 09:00-12:00 Tutorial 1
14:00-17:00 Tutorial 2
18:30-21:00 Welcome Reception
Nov. 24 (Tue.) 09:00-10:20 Plenary Session 1
10:20-10:40 Coffee Break
10:40-12:00 Plenary Session 2
12:00-13:10 Lunch
13:10-14:30 3A: BIST 3B: Fault Diagnosis 3C: Analog and Mixed-signal Testing
14:30-14:45 Coffee Break
14:45-16:05 4A: Industrial Session 4B: Low-Power Testing 4C: On-Line Testing and Silicon Debug
16:05-16:20 Coffee Break
16:20-17:40 5A: Delay Testing 5B: Test Generation (I) 5C: System Test
Nov. 25 (Wed.) 09:00-10:20 6A: Panel Session (I) 6B: DFT 6C: RF and Analog Testing
10:20-10:40 Coffee Break
10:40-12:00 7A: SoC Test 7B: Test Generation (II) 7C: Test Data Compression
12:00-13:30 Lunch
13:30-18:30 Social Event
18:30-20:00 Banquet
Nov. 26 (Thu.) 09:00-10:20 8A: Panel Session (II) 8B: Fault Modeling & Diagnosis 8C: Analog and Mixed-signal Testing
10:20-10:40 Coffee Break
10:40-12:00 9A: Memory Test 9B: Test Generation (III) 9C: Defect-Based Testing