| Date |
Time |
Program |
| Nov. 23 (Mon.) |
09:00-12:00 |
Tutorial 1 |
| 14:00-17:00 |
Tutorial 2 |
| 18:30-21:00 |
Welcome Reception |
| Nov. 24 (Tue.) |
09:00-10:20 |
Plenary Session 1 |
| 10:20-10:40 |
Coffee Break |
| 10:40-12:00 |
Plenary Session 2 |
| 12:00-13:10 |
Lunch |
| 13:10-14:30 |
3A: BIST |
3B: Fault Diagnosis |
3C: Analog and Mixed-signal Testing |
| 14:30-14:45 |
Coffee Break |
| 14:45-16:05 |
4A: Industrial Session |
4B: Low-Power Testing |
4C: On-Line Testing and Silicon Debug |
| 16:05-16:20 |
Coffee Break |
| 16:20-17:40 |
5A: Delay Testing |
5B: Test Generation (I) |
5C: System Test |
| Nov. 25 (Wed.) |
09:00-10:20 |
6A: Panel Session (I) |
6B: DFT |
6C: RF and Analog Testing |
| 10:20-10:40 |
Coffee Break |
| 10:40-12:00 |
7A: SoC Test |
7B: Test Generation (II) |
7C: Test Data Compression |
| 12:00-13:30 |
Lunch |
| 13:30-18:30 |
Social Event |
| 18:30-20:00 |
Banquet |
| Nov. 26 (Thu.) |
09:00-10:20 |
8A: Panel Session (II) |
8B: Fault Modeling & Diagnosis |
8C: Analog and Mixed-signal Testing |
| 10:20-10:40 |
Coffee Break |
| 10:40-12:00 |
9A: Memory Test |
9B: Test Generation (III) |
9C: Defect-Based Testing |
